Rugged 12-GHz probe and calibration substrate for direct probing on circuit components with probe-tip calibration.
The rugged 12-GHz RF probe and calibration substrate allow engineers to directly probe on circuit components with probe-tip calibration for accurate, repetitive measurements.
"Constant shrinking size of circuit components makes soldering semi-rigid RF cables to test gigahertz circuits impractical," said Richard Zai, PacketMicro CTO. "The rugged RF probe and calibration substrate allow engineers to perform probe-tip calibration for accurate and repetitive RF measurements."
HSProbeTM family is specifically designed for bench-top testing of large PCBs. The RF probe comes in five different probe pitches, and the calibration substrate (TCS50) provides the SOLT standards for probe-tip calibration. Together, the RF probes (RP-GR-1215 series), PCB holder (VPH100 series) and Flex Positioner (TP60) are ideal for S-Parameter and TDR measurements required in RF, power-integrity, and signal-integrity measurements. Please stop by Booth#742 at DesignCon 2014 held at Santa Clara Convention Center, Santa Clara, California on January 29 - 30, 2014, for product demonstration.
For RF Probe:
RP-GR-121502, 12 GHz, 1.5", 0.2 mm pitch
RP-GR-121505, 12 GHz, 1.5", 0.5 mm pitch
RP-GR-121508, 12 GHz, 1.5", 0.8 mm pitch
RP-GR-121510, 12 GHz, 1.5", 1.0 mm pitch
For Calibration substrate:
PacketMicro, located in Silicon Valley, provides a wide range of gigahertz probing solutions and offers world-class signal integrity design services. In addition, PacketMicro offers one-stop engineering services in the areas of wireless sensor networks, radio frequency identification (RFID), and high-speed FPGA. For more information, please visit www.packetmicro.com. For more information about HSProbe product line, please visit www.hsprobe.com.
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